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SI4464 Fiches technique(PDF) 4 Page - Silicon Laboratories |
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SI4464 Fiches technique(HTML) 4 Page - Silicon Laboratories |
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4 / 56 page ![]() Si4464/63/61/60 4 Rev 1.2 1. Electrical Specifications Table 1. DC Characteristics1 Parameter Symbol Test Condition Min Typ Max Unit Supply Voltage Range VDD 1.8 3.3 3.6 V Power Saving Modes IShutdown RC Oscillator, Main Digital Regulator, and Low Power Digital Regulator OFF —30— nA IStandby Register values maintained and RC oscillator/WUT OFF —50— nA ISleepRC RC Oscillator/WUT ON and all register values main- tained, and all other blocks OFF —900 — nA ISleepXO Sleep current using an external 32 kHz crystal.2 —1.7 — µA ISensor -LBD Low battery detector ON, register values maintained, and all other blocks OFF —1— µA IReady Crystal Oscillator and Main Digital Regulator ON, all other blocks OFF —1.8 — mA TUNE Mode Current ITune_RX RX Tune, High Performance Mode — 7.2 — mA ITune_TX TX Tune, High Performance Mode — 8 — mA RX Mode Current IRXH High Performance Mode — 13.7 — mA IRXL Low Power Mode2 —10.7— mA TX Mode Current (Si4464/63) ITX_+20 +20 dBm output power, class-E match, 915 MHz, 3.3 V —85— mA +20 dBm output power, class-E match, 460 MHz, 3.3 V —75— mA +20 dBm output power, square-wave match, 169 MHz, 3.3 V —70— mA TX Mode Current (Si4461) ITX_+16 +16 dBm output power, class-E match, 868 MHz, 3.3 V2 —43— mA ITX_+14 +14 dBm output power, Switched-current match, 868 MHz, 3.3 V2 —37— mA ITX_+13 +13 dBm output power, switched-current match, 868 MHz, 3.3 V2 —29— mA TX Mode Current (Si4460) ITX_+10 +10 dBm output power, Class-E match, 868 MHz, 3.3 V2 —18— mA Notes: 1. All specifications guaranteed by production test unless otherwise noted. Production test conditions and max limits are listed in the "Production Test Conditions" section of "1.1. Definition of Test Conditions" on page 14. 2. Guaranteed by qualification. Qualification test conditions are listed in the “Qualification Test Conditions” section in "1.1. Definition of Test Conditions" on page 14. |
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