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SI4464 Fiches technique(PDF) 4 Page - Silicon Laboratories

No de pièce SI4464
Description  HIGH-PERFORMANCE
PDF  56 Pages
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Fabricant  SILABS [Silicon Laboratories]
Site Internet  http://www.silabs.com
Logo SILABS - Silicon Laboratories

SI4464 Fiches technique(HTML) 4 Page - Silicon Laboratories

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Si4464/63/61/60
4
Rev 1.2
1. Electrical Specifications
Table 1. DC Characteristics1
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Supply Voltage
Range
VDD
1.8
3.3
3.6
V
Power Saving Modes IShutdown
RC Oscillator, Main Digital Regulator,
and Low Power Digital Regulator OFF
—30—
nA
IStandby
Register values maintained and RC
oscillator/WUT OFF
—50—
nA
ISleepRC RC Oscillator/WUT ON and all register values main-
tained, and all other blocks OFF
—900
nA
ISleepXO
Sleep current using an external 32 kHz crystal.2
—1.7
µA
ISensor
-LBD
Low battery detector ON, register values maintained,
and all other blocks OFF
—1—
µA
IReady
Crystal Oscillator and Main Digital Regulator ON,
all other blocks OFF
—1.8
mA
TUNE Mode Current
ITune_RX
RX Tune, High Performance Mode
7.2
mA
ITune_TX
TX Tune, High Performance Mode
8
mA
RX Mode Current
IRXH
High Performance Mode
13.7
mA
IRXL
Low Power Mode2
—10.7—
mA
TX Mode Current
(Si4464/63)
ITX_+20
+20 dBm output power, class-E match, 915 MHz,
3.3 V
—85—
mA
+20 dBm output power, class-E match, 460 MHz,
3.3 V
—75—
mA
+20 dBm output power, square-wave match,
169 MHz, 3.3 V
—70—
mA
TX Mode Current
(Si4461)
ITX_+16
+16 dBm output power, class-E match, 868 MHz,
3.3 V2
—43—
mA
ITX_+14
+14 dBm output power, Switched-current match,
868 MHz, 3.3 V2
—37—
mA
ITX_+13
+13 dBm output power, switched-current match,
868 MHz, 3.3 V2
—29—
mA
TX Mode Current
(Si4460)
ITX_+10
+10 dBm output power, Class-E match, 868 MHz,
3.3 V2
—18—
mA
Notes:
1.
All specifications guaranteed by production test unless otherwise noted. Production test conditions and max limits are
listed in the "Production Test Conditions" section of "1.1. Definition of Test Conditions" on page 14.
2.
Guaranteed by qualification. Qualification test conditions are listed in the “Qualification Test Conditions” section in "1.1.
Definition of Test Conditions" on page 14.



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