MM32F103CET datasheet(18/89 Pages) MINDMOTION

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DS_MM32F103xx_o_Ver1.13

Specification

all selected channels, and an interruption occurs when the monitored signal exceeds the

preset threshold. The events generated by the general-purpose timers (TIMx) and the

advanced-control timer (TIM1) can be internally connected to the ADC start trigger to

allow the application to synchronize A/D conversion and timers.

2.2.24 Temperature sensor

The temperature sensor has to generate a voltage that varies linearly with temperature.

The temperature sensor is internally connected to the input channel which is used to con-

vert the sensor output voltage into a digital value.

2.2.25 Serial single line SWD debug port (SW-DP)

Built-in ARM two-wire serial debug port (SW-DP) and Single line (JTAG).

An ARM SW-DP interface is provided to allow a serial wire debugging tool to be connected

to the MCU.

2.2.26 Comparator (COMP)

The devices embed 2 general purpose comparators. that can be used either as standalone

devices (all terminal are available on I/Os) or combined with the timers. The comparators

can be used for a variety of functions including：

• Wake-up from low-power mode triggered by an analog signal,

• Analog signal conditioning,

• Cycle-by-cycle current control loop when combined with the PWM output from a timer.

• Rail-to-rail comparators

• Each comparator has positive and configurable negative inputs used for flexible voltage

• Selection:

– Reusable I/O pins

– Internal comparison voltage CRV selects the voltage divider value of AVDD or

internal reference voltage

• Programmable hysteresis

• Programmable speed/consumption

• The outputs can be redirected to an I/O or to timer inputs for triggering:

– Capture events

– OCref_clr events (for cycle-by-cycle current control)

– Break events for fast PWM shutdowns

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