 |
Moteur de recherche de fiches techniques de composants électroniques |
|
|
Moteur de recherche de fiches techniques de composants électroniques |
|
L99MH98 Fiches technique(PDF) 32 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
L99MH98 Fiches technique(HTML) 32 Page - STMicroelectronics |
|
|
32 / 147 page  CSOSIGx CSOSHx Setting 1 111 Vds of the LS8 mapped on the CSOx Figure 16. Vds measurement by CSO1/2 VDH L99MH98 M SH1 SH2 M SH3 GND M SH8 GND - + VDS_LS1 + - VDS_HS1 VDS_LS2 VDS_HS2 - + + - GND VDH VDH CSO1 CSO2 VDS_LS8 VDS_HS8 - + + - VDH GND SH2 SH8 MUX GND DIODE1 GND DIODE2 GND DIODE4 DIODE1 DIODE2 DIODE3 DIODE4 VDH IDIODE1 VDH IDIODE2 VDH IDIODE4 VDH IDIODE3 ADC SPI 4.2.3 Temperature measurement for calibration and monitoring To further improve indirect current measurement, a temperature control (via 4 external diodes/diode chain) is implemented inside the L99MH98. Each diode/chain will be placed as close as possible to each H-bridge or to a relevant temperature hot-spot. The forward voltage, Vf, of the diode varies with temperature, therefore the diode’s temperature coefficient is needed to get an accurate representation of the junction temperature. The control structure of the diodes is constituted by a current generator that injects a small current (programmable from 250 μA to 1 mA) in the anode of the diode while the cathode will be connected to the ground pin of the L99MH98. The voltage across the diode will then be measured by an internal ADC which will make the value available to the microcontroller: 4 dedicated registers, DIODEx_READ, x = 1...4, will report the read values to the microcontroller by SPI communication. The interval time between one temperature measurement and another is of 1 ms typ. If one or more diodes are not connected the information related to the connected diodes will always be available after 1 ms. Reading the Vf(x°C) at an unknown temperature, knowing the Vf (25 °C) at 25 °C and knowing the temperature coefficient of the Vf, the microcontroller calculates the working temperature by applying the following formula: TC =T25C∘ + VfxC∘ −Vf25C∘ /TenperatureCoefficient (1) Vf (25 °C) varies slightly from device to device: to overcome this behavior, a calibration data during the manufacturing process can be applied: in this case the Vf (25 °C) can be measured in the manufacturing process and the value can be stored in the microcontroller memory. L99MH98 Gates driver DS14611 - Rev 3 page 32/147 |
|
Lien URL |
| ALLDATASHEET vous a-t-il été utile ? [ DONATE ] |
À propos de Alldatasheet | Publicité | Contactez-nous | Politique de confidentialité | Lien vers la fiche technique | Echange de liens | Fabricants All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |
French ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
