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L99MH98 Fiches technique(PDF) 7 Page - STMicroelectronics |
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L99MH98 Fiches technique(HTML) 7 Page - STMicroelectronics |
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7 / 147 page ![]() 2.2 ESD protection Table 3. ESD protection Symbol Parameter Test condition Min Typ Max Unit Electrostatic discharge test (AEC-Q100-002-E) all pins (HBM) - -2 - +2 kV Electrostatic discharge test (AEC-Q100-002-E) output pins SHx (X = 1...8) and VDH versus GND (HBM) - -4 - +4 kV Charge device model (CDM-AEC-Q100-011) all pins - -500 - +500 V Charged device model (CDM-AEC-Q100-011) corner pins - -750 - +750 V 2.3 Thermal data Table 4. Operation junction temperature Symbol Parameter Test condition Min Typ Max Unit Tj Operating junction temperature -40 - 150 °C Tstg Storage temperature -55 - 150 °C All parameters are guaranteed in the temperature range -40 to 150 °C (unless otherwise specified); the device is still operative and functional at higher temperatures (up to 165 °C). Note: • Parameters limits at higher temperatures than 150 °C may change with respect to what is specified as per the standard temperature range. • Device functionality at high temperature is guaranteed by characterization. Table 5. Temperature warning and thermal shutdown Symbol Parameter Test condition Min Typ Max Unit TjTW_ON Junction temperature thermal warning threshold Tj increasing 140 150 160 °C TjSD_ON Junction temperature thermal shutdown threshold Tj increasing 170 180 190 °C TjSD_OFF Junction temperature thermal shutdown threshold Tj decreasing 160 170 180 °C tfTjTW/TSD Temperature warning/shutdown filtering time Tested by scan 24 - 43 µs Note: Those parameters are guaranteed at hot only. 2.3.1 VFQFPN-48 Thermal data Table 6. Packages thermal resistance Symbol Parameter Test condition Value Unit Rthj-amb(1)(2) Thermal resistance junction to ambient (max.) 26 °C/W Rthj-case(3) Thermal resistance junction to case (max.) 4.5 °C/W 1. The parameter is retrieved according to JEDEC 51.2 referring to thermal testing method in still air. 2. PCB designed according to JEDEC 51.7 referring to high effective thermal conductivity test board. • The values quoted are for PCB 129 mm x 60 mm x 1.6 mm ±10%, FR4, 4 layer. • Cu thickness on outer layer 0.070 mm, Cu thickness on inner layer 0.035 mm, Thermal vias separation 1.2 mm, Thermal via diameter 0.3 mm ±0.08 mm, Cu thickness on vias 0.025 mm. • VFQFPN-48 footprint dimensions are 5.4 mm x 5.4 mm. L99MH98 Electrical specifications DS14611 - Rev 3 page 7/147 |
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