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TDA9170 Fiches technique(PDF) 17 Page - NXP Semiconductors |
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TDA9170 Fiches technique(HTML) 17 Page - NXP Semiconductors |
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17 / 22 page ![]() October 1994 18 Philips Semiconductors Preliminary specification YUV picture improvement processor based on histogram modification TDA9170 Fig.7 Static error on average histogram amplitude (pin TAUHM) as a function of effective histogram measuring time in a field. Weff = thw × Nvw × Rmc. Where: thw = horizontal window width (µs). Nvw = vertical window height (lines). Rmc = effective histogram measuring time within window due to miscount in percentage of thw × Nvw. |
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