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ADIS16240ABCZ Fiches technique(PDF) 3 Page - Analog Devices

No de pièce ADIS16240ABCZ
Description  Low Power, Programmable Impact Sensor and Recorder
PDF  16 Pages
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Fabricant  AD [Analog Devices]
Site Internet  http://www.analog.com
Logo AD - Analog Devices

ADIS16240ABCZ Fiches technique(HTML) 3 Page - Analog Devices

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ADIS16240
Rev. 0 | Page 3 of
16
SPECIFICATIONS
TA = 25°C, VDD = 2.4 V to 3.6 V unless otherwise noted.
Table 1.
Parameter
Conditions
Axis
Min
Typ
Max
Unit
ACCELEROMETER
Dynamic Range
±16
±19
g
Initial Sensitivity
51.4
mg/LSB
Sensitivity Temperature Coefficient
−40°C to +85°C
±0.01
%
Sensitivity Change with Supply Voltage
2.4 V < VDD < 3.6 V
X, Y
6
%
Nonlinearity
Compare with best fit line
±2
% FS
Sensor-to-Sensor Alignment Error
±0.1
Degrees
Cross-Axis Sensitivity
±1
%
Initial Bias Error
−2.7
+2.7
g
Bias Temperature Coefficient
±1
mg/°C
Bias Voltage Sensitivity
TBD
mg/V
Output Noise
24
mg rms
Noise Density
480
μg/
√Hz
Bandwidth
No external capacitance
X, Y
1600
Hz
No external capacitance
Z
550
Hz
Sensor Resonant Frequency
5.5
kHz
Self-Test Change in Output Response
X
−10
−21
−39
LSB
Y
+10
+21
+39
LSB
Z
+10
+36
+65
LSB
TEMPERATURE SENSOR SCALE FACTOR
TEMP_OUT = 0x0133 (307) at 25°C
0.244
°C/LSB
ADC INPUT
Input Range
0
VDD
V
Resolution
10
Bits
Integral Nonlinearity, INL
±1
±2
LSB
Differential Nonlinearity, DNL
±1
±1.25
LSB
Offset Error
±1
±2
LSB
Gain Error
±1
±3
LSB
Input Capacitance
11
pF
LOGIC INPUTS1
Input High Voltage, VINH
2.0
V
Input Low Voltage, VINL
0.8
V
Logic 1 Input Current, IINH
VIH = VDD
±0.2
±1
μA
Logic 0 Input Current, IINL
VIL = 0 V
−40
−60
μA
Input Capacitance, CIN
10
pF
DIGITAL OUTPUTS
Output High Voltage, VOH
ISOURCE = 1.6 mA
2.4
V
Output Low Voltage, VOL
ISINK = 1.6 mA
0.4
V
START-UP TIME
Initial, Reset Recovery
32
ms
FLASH MEMORY
Endurance2
10,000
Cycles
Data Retention3
TJ = 85°C
20
Years
CONVERSION RATE SETTING
4096
SPS
POWER SUPPLY
2.4
3.6
V
Average Supply Current4
SMPL_PRD = 0x1F, VDD = 2.5 V
1
mA
Sleep Mode Current
100
μA
1 Note that the inputs are 5 V tolerant.
2 Endurance is qualified as per JEDEC Standard 22, Method A117 and measured at −40°C, +25°C, +85°C, and +105°C.
3 Retention lifetime equivalent at junction temperature (TJ) of 55°C as per JEDEC Standard 22, Method A117. Retention lifetime decreases with junction temperature.
4 Instantaneous current has periodic peaks at the sample rate that can reach 30 mA.



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