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STF36N60M6 Fiches technique(PDF) 4 Page - STMicroelectronics |
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STF36N60M6 Fiches technique(HTML) 4 Page - STMicroelectronics |
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4 / 13 page ![]() Symbol Parameter Test conditions Min. Typ. Max. Unit ISDM(1) Source-drain current (pulsed) - 102 A VSD (2) Forward on voltage VGS = 0 V, ISD = 30 A - 1.6 V trr Reverse recovery time ISD = 30 A, di/dt = 100 A/µs, VDD = 60 V (see Figure 15. Test circuit for inductive load switching and diode recovery times) - 340 ns Qrr Reverse recovery charge - 5.3 µC IRRM Reverse recovery current - 31 A trr Reverse recovery time ISD = 30 A, di/dt = 100 A/µs, VDD = 60 V, Tj = 150 °C (see Figure 15. Test circuit for inductive load switching and diode recovery times) - 430 ns Qrr Reverse recovery charge - 7.7 µC IRRM Reverse recovery current - 36 A 1. Pulse width is limited by safe operating area. 2. Pulse test: pulse duration = 300 μs, duty cycle 1.5%. STF36N60M6 Electrical characteristics DS12609 - Rev 1 page 4/13 |
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