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M36DR232B Fiches technique(PDF) 40 Page - STMicroelectronics |
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M36DR232B Fiches technique(HTML) 40 Page - STMicroelectronics |
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40 / 46 page ![]() M36D232A, M36DR232B 40/46 Table 33. SRAM Low VCCS Data Retention Characteristics (1, 2) (TA = –40 to 85°C; VDDS = 1.65V to 2.2V) Note: 1. All other Inputs VIH ≤ VDD–0.2V orVIL ≤ 0.2V. 2. Sampled only. Not 100% tested. Figure 23. SRAM Low VDDS Data Retention AC Waveforms, E1S Controlled Figure 24. SRAM Low VDDS Data Retention AC Waveforms, E2S Controlled Symbol Parameter Test Condition Min Max Unit IDDDR Supply Current (Data Retention) VDDS = 1.0V, E1S ≥ VDDS – 0.2V, E2S ≥ VDDS – 0.2V or E2S ≤ 0.2V, f = 0 25 µA VDR Supply Voltage (Data Retention) E1S ≥ VDDS – 0.2V, E2S ≤ 0.2V, f = 0 12.3 V tCDR Chip Disable to Power Down E1S ≥ VCCS – 0.2V, E2S ≤ 0.2V, f = 0 0ns tR Operation Recovery Time tRC ns AI90224 1.65 V E1S tCDR E1S ≥ VDDS – 0.2V 1.2 V VDR VSSS VDDS tR DATA RETENTION MODE AI90225 1.65 V E2S tCDR E2S ≤ 0.2V VDR VSSS VDDS tR DATA RETENTION MODE 0.4 V |
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