ADIS16501SLASHPCBZ datasheet(39/45 Pages) AD

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Data Sheet

ADIS16501

USER REGISTER DEFINITIONS

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Rev. B | 39 of 45

Data Update Rate in External Sync Modes

When using the input sync option in scaled sync mode (Regis-

ter MSC_CTRL, Bits[3:2] = 10, see Table 107), the output data rate

is equal to

fSYNC×KECSF/DEC_RATE+1

where:

fSYNC is the frequency of the clock signal on the SYNC pin.

KESCF is the value from the UP_SCALE register (see Table 109).

When using direct sync mode, KESCF = 1.

The NULL_CNFG register, Bits[3:0] establish the total average time

(tA) for the bias estimates, and the NULL_CNFG register, Bits[13:8]

provide the on/off controls for each sensor. The factory default

configuration for the NULL_CNFG register enables the bias null

command for the gyroscopes, disables the bias null command for

the accelerometers, and sets the average time to ~32 sec.

Global Commands (GLOB_CMD)

Table 112. GLOB_CMD Register Definition

Addresses

Default

Access

Flash Backup

0x68, 0x69

Not applicable

Table 113. GLOB_CMD Bit Definitions

Bits

Description

[15:8]

Reserved

Software reset

[6:5]

Reserved

Flash memory test

Flash memory update

Sensor self test

Factory calibration restore

Reserved

The GLOB_CMD register (see Table 112 and Table 113) provides

trigger bits for several operations. Write a 1 to the appropriate bit

in GLOB_CMD to start a particular function. During the execution of

these commands, data production stops, pulsing stops on the DR

pin, and the SPI does not respond to requests. Table 1 provides the

execution time for each GLOB_CMD command.

Software Reset

Use the following DIN sequence to set Register GLOB_CMD, Bit

7 = 1, which triggers a reset: 0xE880, then 0xE900. This reset

clears all data, and then restarts data sampling and processing.

This function provides a firmware alternative to toggling the RST pin

(see Table 5, Pin F3).

Flash Memory Test

Use the following DIN sequence to set Register GLOB_CMD,

Bit 4 = 1, which tests the flash memory: 0xE810, then 0xE900.

The command performs a CRC computation on the flash memory

(excluding user register locations) and compares it to the original

CRC value, which comes from the factory configuration process.

If the current CRC value does not match the original CRC value,

failing result.

Flash Memory Update

Use the following DIN sequence to set Register GLOB_CMD, Bit

3 = 1, which triggers a backup of all user configurable registers in

the flash memory: 0xE808, then 0xE900. The DIAG_STAT register,

Bit 2 (see Table 12) identifies success (0) or failure (1) in complet-

ing this process.

Sensor Self Test

Use the following DIN sequence to set Register GLOB_CMD, Bit

2 = 1, which triggers the self test routine for the inertial sensors:

0xE804, then 0xE900. The self test routine uses the following steps

to validate the integrity of each inertial sensor:

1. Measure the output on each sensor.

2. Activate an internal stimulus on the mechanical elements of

each sensor to move them in a predictable manner and create

an observable response in the sensors.

3. Measure the output response on each sensor.

4. Deactivate the internal stimulus on each sensor.

5. Calculate the difference between the sensor measurements

from Step 1 (stimulus is off) and from Step 4 (stimulus is on).

6. Compare the difference with internal pass and fail criteria.

7. Report the pass and fail result to Register DIAG_STAT, Bit 5

(see Table 12).

Motion during the execution of this test can indicate a false failure.

Factory Calibration Restore

Use the following DIN sequence to set Register GLOB_CMD,

Bit 1 = 1, to restore the factory default settings for the

MSC_ CTRL, DEC_RATE, and FILT_CTRL registers and to

clear all user configurable bias correction settings: 0xE802,

then 0xE900. Executing this command results in writing 0x0000

to the following registers: XG_BIAS_LOW, XG_BIAS_HIGH,

YG_BIAS_LOW, YG_BIAS_HIGH, ZG_BIAS_LOW, ZG_BIAS_

HIGH, XA_BIAS_LOW, XA_BIAS_HIGH, YA_BIAS_LOW,

YA_BIAS_HIGH, ZA_BIAS_LOW, and ZA_BIAS_HIGH.

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