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FXLS8967AF Fiches technique(PDF) 90 Page - NXP Semiconductors |
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FXLS8967AF Fiches technique(HTML) 90 Page - NXP Semiconductors |
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90 / 98 page ![]() NXP Semiconductors FXLS8967AF 3-Axis Low-g Accelerometer Term Description Noise density and RMS- integrated noise Noise density is defined as the noise per unit of square root bandwidth and is typically expressed in units of mg/√Hz or μg/√Hz for a consumer grade accelerometer. Noise is measured with the device held stationary in a 1g field and isolated from environmental noise and mechanical vibration. The RMS noise at a given ODR can be estimated as follows: Nrms = ND * √BW For example, in the ±2 g FSR, operating in HPM with an ODR of 400 Hz, the estimated RMS noise would be: Nrms = 280 µg/√Hz * √(400/2) Hz = 3.96 mg (~ 4 LSB). Output data rate, decimation factor, and power consumption The Output Data Rate (ODR) defines the rate at which acceleration data is output from FXLS8967AF. Depending on the operating mode and ODR that is selected, different decimation factors (oversampling ratios) are applied. The decimated output data is supplied at the ODR rate, even though multiple samples of the sensor data may have been used to calculate this average result. In FXLS8967AF lowest power mode, the decimation factor is always 1, leading to the best power performance at the expense of the poorest noise (resolution) performance. In high performance mode, the decimation factor is automatically increased to the maximum possible value for a given ODR, resulting in the best noise (resolution) performance at the expense of the poorest power consumption. In motion detection mode with BT_MODE=VDD, use of HPM or FPM mode is not advised. Only the default LPM mode should be used. Primary Device that initiates and drives the communication with secondary devices. Secondary Device or devices that responds to communication initiated by primary device. Self-Test The integrated self-test function can be used to verify correct transducer and signal chain operation without the need to apply an external acceleration stimulus. When the self-test function is activated for each axis, an electrostatic actuation force is applied to the proof mass, simulating a small change in acceleration. The self-test function of the device is independently exercisable for each axis, along with a selectable displacement direction (polarity). The device need not be static while exercising the self-test function as it is insensitive to any external physical acceleration. Refer to AN5311[2] for more details on self-test. Sensitivity The accelerometer sensitivity, also known as scale-factor, represents the change in acceleration input corresponding to 1 LSB change in output and is typically measured in either mg/LSB or LSB/g. Zero-g offset The accelerometer zero-g offset describes the deviation of the sensor output from the ideal 0g value when no motion or gravity is acting on it. With an accelerometer stationary and placed on a level, horizontal surface, the ideal output is 0 g for the X and Y axes. Likewise, if the accelerometer is placed on a vertical plane, the ideal output is 0 g for the Z-axis. The deviation of each output from the ideal value is called zero-g offset. Offset is, to some extent, a result of stress on the sensor and how well the sensor is leveled when soldered to the board. Therefore, the zero-g offset can change after mounting the sensor onto a printed circuit board or exposing it to extensive mechanical stress. For applications that require increased precision, any residual post-board mount offset may be removed using the OFF_X/Y/Z registers, or alternatively, in the host application software. Table 121. Glossary...continued 21 References [1] AN1902 — Assembly Guidelines for QFN and DFN Packages, http://nxp.com/files/analog/doc/app_note/AN1902.pdf [2] AN5311 — FXLS8962AF self-test procedure, https://www.nxp.com/docs/en/application-note/AN5311.pdf [3] UM10204 — I2C-bus specification and user manual, http://www.nxp.com/documents/user_manual/UM10204.pdf FXLS8967AF All information provided in this document is subject to legal disclaimers. © NXP B.V. 2021. All rights reserved. Objective data sheet Rev. 1 — 27 April 2021 90 / 98 |
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