FXLS8967AF datasheet(8/98 Pages) NXP

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NXP Semiconductors

FXLS8967AF

3-Axis Low-g Accelerometer

VDD = 1.8 V to 3.0 V, T = –40 °C to 105 °C, unless otherwise noted.

Typical values represent mean or mean ±1 σ values, depending on the specific parameter.

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

±2 g mode

0.87

0.98

1.12

±4 g mode

1.74

1.95

2.23

±8 g mode

3.47

3.91

4.46

±16 g mode

6.94

7.81

8.93

mg/LSB

±2 g mode

896

1024

1152

±4 g mode

448

512

576

±8 g mode

224

256

288

SEN

Nominal sensitivity

±16 g mode

112

128

144

LSB/g

SENTOL

Sensitivity tolerance[1]

—

±2.5

—

%SEN

TCS

Temperature coefficient of

sensitivity[1]

–40 °C to +105 °C

—

±0.01

—

%/°C

OFFPBM

Zero-g offset, post-board mount [1]

—

–550

±250

550

TCOPBM

Zero-g offset temperature coefficient,

post-board mount[1]

–40 °C to +105 °C

—

±1

—

mg/°C

CAS

Cross-axis sensitivity[2]

±2/4 g mode

—

±0.5

—

±4 g mode, X axis

—

–144

—

±4 g mode, Y axis

—

143

—

±4 g mode, Z axis

—

–423

—

±8 g mode, X axis

—

–71

—

±8 g mode, Y axis

—

±8 g mode, Z axis

—

–213

—

±16 g mode, X axis

—

–36

—

±16 g mode, Y axis

—

STOC

Self-test output change

±16 g mode, Z axis

—

107

—

LSB

±4 g mode

–1600

—

+1600

±8 g mode

–800

—

+800

STOF

Self-test offset

±16 g mode

–400

—

+400

LSB

BWMAX

Maximum signal bandwidth

ODR = 3200 Hz

—

1600

—

ODRMAX

Maximum ODR

—

3200

—

NSDHPM

Noise spectral density, high

performance mode

±2 g mode

—

280

—

µg/√Hz

NSDLPM-1

Noise spectral density, low-power

mode, high-ODR range[3]

200 Hz ≤ ODR

≤ 3200 Hz,

±2 g mode

—

1120

to 280

—

µg/√Hz

NSDLPM-2

Noise spectral density, low-power

mode, low-ODR range[3]

0.781 Hz ≤

ODR < 200 Hz,

±2 g mode

—

16.8

to 1.1

—

mg/√Hz

Table 7. Accelerometer sensor performance parameters...continued

FXLS8967AF

All information provided in this document is subject to legal disclaimers.

Objective data sheet

Rev. 1 — 27 April 2021

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