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AM29BDS323D Fiches technique(PDF) 27 Page - Advanced Micro Devices |
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AM29BDS323D Fiches technique(HTML) 27 Page - Advanced Micro Devices |
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27 / 44 page ![]() Am29BDS323D 27 P R E L I M INARY TEST CONDITIONS Table 7. Test Specifications Key to Switching Waveforms CL Device Under Test Figure 7. Test Setup Test Condition 11A Unit Output Load Capacitance, CL (including jig capacitance) 30 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0–VCC V Input timing measurement reference levels VCC/2 V Output timing measurement reference levels VCC/2 V WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) VCC 0.0 V Output Measurement Level Input VCC/2 VCC/2 Figure 8. Input Waveforms and Measurement Levels |
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