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MFRC522 Fiches technique(PDF) 82 Page - NXP Semiconductors |
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MFRC522 Fiches technique(HTML) 82 Page - NXP Semiconductors |
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82 / 96 page ![]() MFRC522_33 © NXP B.V. 2009. All rights reserved. Product data sheet PUBLIC Rev. 3 — 26 October 2009 112133 82 of 96 NXP Semiconductors MFRC522 Contactless reader IC 16.1.3.3 Example: Output test signals ADC channel I and ADC channel Q Figure 30 shows the channel behavior test signals ADC_I and ADC_Q on pins AUX1 and AUX2, respectively. The AnalogTestReg register is set to 56h. (1) MinLevel (1 V/div) on pin AUX2. (2) Corr1 (1 V/div) on pin AUX1. (3) RF field. Fig 29. Output test signals Corr1 on pin AUX1 and MinLevel on pin AUX2 10 µs/div 001aak598 (1) (2) (3) (1) ADC_I (1 V/div) on pin AUX1. (2) ADC_Q (500 mV/div) on pin AUX2. (3) RF field. Fig 30. Output ADC channel I on pin AUX1 and ADC channel Q on pin AUX2 5 µs/div 001aak599 (1) (2) (3) |
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