MFRC522 datasheet(62/96 Pages) NXP

62 / 96 page

MFRC522_33

Product data sheet

PUBLIC

Rev. 3 — 26 October 2009

112133

62 of 96

NXP Semiconductors

MFRC522

Contactless reader IC

9.3.4.6

TestBusReg register

Shows the status of the internal test bus.

9.3.4.7

AutoTestReg register

Controls the digital self-test.

Table 126. TestPinValueReg register bit descriptions

Bit

Symbol

Value Description

UseIO

enables the I/O functionality for the test port when one of the serial

interfaces is used

the input/output behavior is deﬁned by value TestPinEn[5:0] in the

TestPinEnReg register

the value for the output behavior is deﬁned by TestPinValue[5:0]

6 to 1 TestPinValue

[5:0]

deﬁnes the value of the test port when it is used as I/O and each

output must be enabled by TestPinEn[5:0] in the TestPinEnReg

Remark: Reading the register indicates the status of pins D6 to D1

if the UseIO bit is set to logic 1. If the UseIO bit is set to logic 0, the

value of the TestPinValueReg register is read back.

reserved

reserved for future use

Table 127. TestBusReg register (address 35h); reset value: xxh bit allocation

Bit

Symbol

TestBus[7:0]

Access

Table 128. TestBusReg register bit descriptions

Bit

Symbol

Description

7 to 0

TestBus[7:0]

shows the status of the internal test bus

the test bus is selected using the TestSel2Reg register; see

Section 16.1 on page 79

Table 129. AutoTestReg register (address 36h); reset value: 40h bit allocation

Bit

Symbol

reserved

AmpRcv

RFT

SelfTest[3:0]

Access

R/W

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