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ST52T410 Fiches technique(PDF) 66 Page - STMicroelectronics |
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ST52T410 Fiches technique(HTML) 66 Page - STMicroelectronics |
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66 / 84 page ![]() ST52T410/ST52T420/E420 66/84 11 ELECTRICAL CHARACTERISTICS 11.1 Parameter Conditions Unless otherwise specified, all voltages are referred to Vss. 11.1.1 Minimum and Maximum values. Unless otherwise specified, the minimum and maximum values are guaranteed in the worst conditions of environment temperature, supply voltage and frequencies production testing on 100% of the devices with an environmental temperature at TA=25°C and TA=TAmax (given by the selected temperature range). Data is based on characterization results, design simulation and/or technology characteristics are indicated in the table footnotes and are not tested in production. The minimum and maximum values are based on characterization and refer to sample tests, representing the mean value plus or minus three times the standard deviation (mean ±3Σ). 11.1.2 Typical values. Unless otherwise specified, typical data is based on TA=25°C, VDD=5V (for the 4.5≤VDD≤5.5V voltage range). They are provided only as design guidelines and are not tested. 11.1.3 Typical curves. Unless otherwise specified, all typical curves are provided only as design guidelines and are not tested. Figure 11.1 Pin loading conditions 11.1.4 Loading capacitor. The loading condition used for pin parameter measurement is illustrated in Figure 11.1. 11.1.5 Pin input voltage. Input voltage measurement on a pin of the device is described in Figure 11.2 Figure 11.2 Pin input Voltage 11.2 Absolute Maximum Ratings Stresses above those listed as “absolute maximum ratings” may cause permanent damage to the device. This is a stress rating only. Functional operation of the device under these conditions is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability. ST52 PIN C L ST52 PIN V IN |
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