| Moteur de recherche de fiches techniques de composants électroniques |
|
FCIP Fiches technique(PDF) 3 Page - Amkor Technology |
|
|
|||||||||||||||||||||||||||||
FCIP Fiches technique(HTML) 3 Page - Amkor Technology |
|
3 / 4 page ![]() Flip Chip BGA Package (Cont.) Technology f Substrates ▷ 4-18 layer laminate build-up substrates ▷ High CTE ceramic ▷ Coreless f Bump types ▷ Eutectic Sn/Pb ▷ Pb-free ▷ Cu pillar (array and fine-pitch peripheral) f Package formats ▷ Bare die ▷ Lidded ▷ Molded f 90 µm minimum array bump pitch f <100 µm minimum peripheral bump pitch f Die sizes up to 29 mm f Package sizes from 10 mm to 66 mm (85 mm in development) f 0.4 mm, 0.5 mm, 0.65 mm, 0.8 mm and 1.0 mm pitch BGA footprints FCBGA/LGA (Bare die) Flip chip packaging solution for most graphics, PC chipset and low-end ASIC applications fcCeramic CBGA/CLGA/CLLGA/solder column interposer Original packaging solution for flip chip products Flip Chip CSP Package Features f Designed for high-frequency applications f Target market – cell phones, handheld electronics f Thin-core laminate or ceramic package construction f Overmolded for handling and second level reliability f Accommodates package sizes from 3 mm to 15 mm f Flip chip bump pitches of 150 µm mininum for peripheral array, 250 µm minimum for area array f Available in 0.5-1.0 mm BGA ball pitch, as well as LGA interconnect f Minimum package thickness of 0.80 mm for LGA interconnect, 1.0 mm for 0.5 mm BGA pitch and 1.2 mm for 0.8 mm BGA pitch fcCSP Flip chip solution for CSP package technology Flip Chip System in Package (SiP) Flip chip SiP package is an extension of the SiP product offering from Amkor with the device interconnect technology being flip chip rather than traditional wirebond interconnects. The package may contain multiple passive components, silicon and/or GaAs devices bumped with traditional solder bumps or solder coated copper pillar bumps housed in 2-layer or 4-layer high-density substrates. This package format is gaining traction in RF power amplifier and RF front end module applications for size, performance and cost reasons. Controlled collapse of the bumps leads to predictable interconnect impedance and hence more stable product performance. The low-solder volume in the ‘wetting tip’ allows for the elimination of the solder mask from underneath the die which reduces the substrate complexity and cost and removes a major barrier for adopting the fine pitch FC interconnection technology in the RF application space. Flip chip interconnection may also preclude the need for wafer backgrinding (for mold cap thickness 0.9 mm) which leads to further reduction in product cost and simplification of the process flow. |
|
|
Lien URL |
| ALLDATASHEET vous a-t-il été utile ? [ DONATE ] |
À propos de Alldatasheet | Publicité | Contactez-nous | Politique de confidentialité | Lien vers la fiche technique | Echange de liens | Fabricants All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |