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LB11693H Fiches technique(PDF) 14 Page - ON Semiconductor |
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LB11693H Fiches technique(HTML) 14 Page - ON Semiconductor |
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14 / 24 page ![]() LB11693H No.A0287-14/24 IOleak VD1, VD2(EX, OUT1) After setting the logic state so that the high and low side output transistors for the corresponding phase are in the off state, proceed to the measurement itself. Set the switch SW to position 1 for source transistor leakage measurement, and to position for sink transistor leakage measurement. The figure shows the circuit used for measuring OUT3. Use similar circuits for measurement of the other phases. Input the logic states shown in the table so that the output transistor for the corresponding phase is off. Set IO to 0.7A when measuring VD1. Set IO to 1.5A when measuring VD2. The figure shows the circuit used for measuring OUT1. Use similar circuits for measurement of the other phases. |
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