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AN3137 Fiches technique(PDF) 29 Page - STMicroelectronics |
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AN3137 Fiches technique(HTML) 29 Page - STMicroelectronics |
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29 / 42 page ![]() AN3137 Methods for precision improvement Doc ID 16983 Rev 3 29/42 Figure 16. Effect of sampling time extension If the maximum register value of the sampling time setting is reached and the problem is still present, you need a more complex solution which is applicable also for measurements of source with extra high internal impedance (see the section Workaround for extra high impedance sources below). Note that for this application you must take into account not only the internal sampling capacitance, but also any external parasitic capacitance (in parallel to Cext), such as: pin capacitance, PCB path capacitance, etc. Do not add any external capacitor (Cext) to the input pin when applying this workaround. Its capacity will increase the timing constant (Rin * Csh || Cext) and the problem will remain. Workaround for extra high impedance sources This workaround consists of 2 parts: a hardware change and a software change. Hardware change: The hardware change consists of adding a large external capacitor (Cext) to the input pin. The capacity size connected to the input pin must reach the value that causes the discharging of the internal sampling capacity Csh to the external capacitor Cext without increasing the voltage on Cext to more than 0.5 lsb. For example: If the internal capacitor (Csh = 16 pF) is charged to full scale (Umax, which corresponds to 4096 lsb), then the external capacitor Cext must be charged at maximum 0.5 lsb voltage level (Ulsb) after discharging Csh to it. The capacity of Cext will then be: The closest larger standard value chosen here is: Cext = 150 nF. C ext C sh U max U lsb -------------- ⋅ ≥ 16pF 4096 0.5 ------------- 131nF ≈ ⋅ = |
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