SCAS641

– JULY 2000

7

POST OFFICE BOX 655303

DALLAS, TEXAS 75265

electrical characteristics over recommended operating free-air temperature range (unless

otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP†

MAX

UNIT

VIK

Input clamp voltage

VDD = 3.135 V,

II = –18 mA

–1.2

V

RI

Input resistance

XIN-XOUT

VDD = 3.465 V,

VI = VDD –0.5 V

100

k

XOUT

VDD = 3.135 V,

VI = VDD –0.5 V

50

mA

IIH

High-level input current

MultSel0, MultSel1,

SelA, SelB

VDD = 3.465 V,

VI = VDD

10

A

SEL100/133

SPREAD, PWRDWN

VDD = 3.465 V,

VI = VDD

5

A

XOUT

VDD = 3.135 V,

VO = 0 V

– 5

mA

IIL

Low level input current

MultSel0, MultSel1,

SelA, SelB,

VDD = 3.465 V,

VI = GND

–10

A

IIL

Low-level input current

SEL100/133

SPREAD, PWRDWN

VDD = 3.465 V,

VI = GND

–5

A

I_REF

VDD = 3.465 V,

Rr = 221

–5.5

mA

IOZ

High-impedance-state output current

VDD = 3.465 V

SELA, SELB = H,

SEL100/133 H

L

VO = VDD or GND

PWRDWN = H

10

A

IDD(Z)

High-impedance-state supply current

VDD = 3.465 V

SELA, SELB = H,

SEL100/133 H

L

PWRDWN = H

40

mA

IDD(PD)

PWRDWN state supply current

VDD = 3.465 V,

PWRDWN = L

30

mA

IDD

Dynamic supply current

VDD = 3.465 V

PWRDWN = H,

HCLK = 133 MHz,

SSC = ON/OFF,

CL = MAX

Rref = 475 ,

IOUT = 6 Iref

250

mA

CI

Input capacitance‡

VDD = 3.3 V,

VI = VDD or GND

2

5

pF

C(XTAL)

Crystal terminal capacitance

VDD = 3.3 V,

VI = 0.3 V

18

pF

† All typical values are measured at their respective nominal VDD values.

‡ These parameters are ensured by design and lab characterization, not 100% production tested.

Control SELx, PWRDWN, SPREAD threshold levels during FUNC w/c level tests.

CL = MAX = 5 pF, Rs = 33.2 , Rp = 49.9

at HCLK/HCLK (Type X1)

CL = MAX = 20 pF, RL = 500

at 48 MHz, REF (Type 3)

CL = MAX = 30 pF, RL = 500

at PCIx, 3V66, 3VMREF, 3VMREF (Type 5)