L9963E datasheet(74/184 Pages) STMICROELECTRONICS

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•

Fault is not propagated through the FAULT Line;

•

Conversion routine doesn’t go into Configuration Override;

•

GPIOx_UT and GPIOx_OT SPI flags are not set.

Masking OT/UT failure is useful when using analog inputs to measure sensors different than cell NTCs.

If voltage (measured using TCYCLEADC_000) is lower than VFASTCHG_OT_TH threshold:

•

Corresponding Fast charge OT fault flag is set and latched into GPIO_fastchg_OT register;

•

Fault is propagated through the FAULT Line;

•

Conversion routine goes into Configuration Override.

VGPIO_FASTCH_OT_DELTA has to be intended as a delta increase to be added to VGPIOAN_OT threshold, as total

Fast charge threshold must be always higher than VGPIO_UV.

Fast charge stop fault can be masked via Gpiox_fastchg_OT_MSK bit. When masking is activated:

•

Fault is not propagated through the FAULT Line;

•

Conversion routine doesn’t go into Configuration Override;

•

GPIOx_fastchg_OT SPI flag is not set.

For further details refer to Section 4.12 Voltage conversion routine.

4.11.19

Current sense overcurrent

Current sense circuitry includes an overcurrent diagnostic active while the Coulomb Counter is enabled and the

device is in Cyclic Wakeup. The diagnostic compares each sample of the current sense conversion with a digital

threshold (ICURR_SENSE_OC_SLEEP). If the converted value is higher than ICURR_SENSE_OC_SLEEP, overcurrent

detection occurs.

In case of curr sense OVC detection:

•

Corresponding fault flag is set and latched into curr_sense_ovc_sleep register

•

Fault is propagated through the FAULT Line

•

Normal mode is entered

Failure can be masked by setting ovc_sleep_msk = 1.

Current sense circuitry includes also an overcurrent diagnostic active while the Coulomb Counter is enabled and

the device is in Normal. The diagnostic compares each sample of the current sense conversion with a digital

threshold (ICURR_SENSE_OC_NORM). If the converted value is higher than ICURR_SENSE_OC_NORM, overcurrent

detection occurs.

In case of curr sense OVC detection:

•

Corresponding fault flag is set and latched into curr_sense_ovc_norm register

•

Fault is propagated through the FAULT Line

Failure can be masked by setting ovc_norm_msk = 1.

4.11.20

Current sense open diagnostic

Curr sense performs open diagnostic using internal IISENSEP and IISENSEM currents. If ISENSEP or ISENSEM pin

voltages are higher than VISENSEP_OPEN_th or VISENSEM_OPEN_th threshold for a time longer than digital filter

TCURR_SENSE_OPEN_filter, current sense open detection occurs.

In case of curr sense open detection, which occurs only if coulomb counter is enabled (CoulombCounter_en =

1):

•

Corresponding fault flag is set and latched into sense_plus_open or sense_minus_open register. Because

the CSA is choppering the inputs, both latches could be alternatively set

•

Fault is propagated through the FAULT Line

4.11.21

Reference voltage monitor

Two BG references are used in order to guarantee independency between monitor functions. For each pair of

cells, the two corresponding ADCs are referenced to different bandgaps. This guarantees results independency

when performing Cell open with ADC_CROSS_CHECK = 1 diagnostic.

L9963E

Safety and diagnostic features

DS13636 - Rev 12

page 74/184

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