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BQ40Z50-R1 Fiches technique(PDF) 7 Page - Texas Instruments

No de pièce BQ40Z50-R1
Description  bq40z50-R1 1-Series, 2-Series, 3-Series, and 4-Series Li-Ion Battery Pack Manager
PDF  56 Pages
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Fabricant  TI2 [Texas Instruments]
Site Internet  https://www.ti.com
Logo TI2 - Texas Instruments

BQ40Z50-R1 Fiches technique(HTML) 7 Page - Texas Instruments

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VC and PACK Dividers
CHANx
1.9 M
VC4
0.1 M
10
ADC Mux
ADC
CHANx
1.9 M
PACK
0.1 M
10
ADC Mux
ADC
OCD, SCC, SCD Comparators and Coulomb Counter
SRP
SRN
3.8 k
3.8 k
Comparator
Array
100
100
Coulomb
Counter
Φ2
Φ1
Φ2
Φ1
Φ2
Φ1
Φ2
Φ1
4
bq40z50-R1
www.ti.com
SLUSCB3 – JULY 2015
Figure 3. Pin Equivalent Diagram 3
7 Specifications
7.1 Absolute Maximum Ratings
Over-operating free-air temperature range (unless otherwise noted)
(1)
MIN
MAX
UNIT
Supply voltage range,
BAT, VCC, PBI
–0.3
30
V
VCC
PACK, SMBC, SMBD, PRES or SHUTDN, BTP_INT, DISP
–0.3
30
V
TS1, TS2, TS3, TS4
–0.3
VREG + 0.3
V
PTC, PTCEN, LEDCNTLA, LEDCNTLB, LEDCNTLC
–0.3
VBAT + 0.3
V
SRP, SRN
–0.3
0.3
V
VC3 + 8.5, or
VC4
VC3 – 0.3
V
Input voltage range,
VSS + 30
VIN
VC2 + 8.5, or
VC3
VC2 – 0.3
V
VSS + 30
VC1 + 8.5, or
VC2
VC1 – 0.3
V
VSS + 30
VSS + 8.5, or
VC1
VSS – 0.3
V
VSS + 30
CHG, DSG
–0.3
32
Output voltage range,
VO
PCHG, FUSE
–0.3
30
V
Maximum VSS current, ISS
50
mA
Storage temperature, TSTG
–65
150
°C
Lead temperature (soldering, 10 s), TSOLDER
300
°C
(1)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.
7.2 ESD Ratings
VALUE
UNIT
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
±2000
Electrostatic
V(ESD)
V
Charged-device model (CDM), per JEDEC specification JESD22-
discharge
±500
C101(2)
(1)
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2)
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
Copyright © 2015, Texas Instruments Incorporated
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