Philips Semiconductors

Product Specification Rev. 3.1

February 2005

Functional Specification

Standard Label IC SL2 ICS20

21

4 INLET/LABEL CHARACTERISATION AND TEST

The parameters recommended to be characterised for the inlet/label are:

Parameter

Symbol

Conditions

Resonant frequency

fres

Resonant frequency @ Tamb = 22 °C @ Hmin

Threshold value of the field strength for

read single block command

Hmin

Read single block command OK

Threshold value of the field strength for

write single block command

Hwrite

Write single block (and verifying read single

block) command OK

To detect damage of EEPROM cells during production of inlets/labels a final test of the EEPROM

after assembly of the inlet/label is recommended. This is necessary to achieve lowest failure rates.