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STM32L021D4 Fiches technique(PDF) 84 Page - STMicroelectronics

No de pièce STM32L021D4
Description  Access line ultra-low-power 32-bit MCU Arm®-based Cortex®-M0, 16KB Flash, 2KB SRAM, 512B EEPROM, ADC, AES
PDF  114 Pages
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Fabricant  STMICROELECTRONICS [STMicroelectronics]
Site Internet  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32L021D4 Fiches technique(HTML) 84 Page - STMicroelectronics

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Electrical characteristics
STM32L021x4
84/114
DocID027982 Rev 5
Figure 27. Typical connection diagram using the ADC
1. Refer to Table 53: ADC characteristics for the values of RAIN, RADC and CADC.
2. Cparasitic represents the capacitance of the PCB (dependent on soldering and PCB layout quality) plus the
pad capacitance (roughly 7 pF). A high Cparasitic value will downgrade conversion accuracy. To remedy
this, fADC should be reduced.
6.3.16
Temperature sensor characteristics
Table 56. Temperature sensor calibration values
Calibration value name
Description
Memory address
TS_CAL2
TS ADC raw data acquired at
temperature of 130 °C
± 5°C,
VDDA= 3 V ± 10 mV
0x1FF8 007E - 0x1FF8 007F
Table 57. Temperature sensor characteristics
Symbol
Parameter
Min
Typ
Max
Unit
TL(1)
1. Guaranteed by characterization results, not tested in production.
VSENSE linearity with temperature
-
±1
±2°C
Avg_Slope(1)
Average slope
1.48
1.61
1.75
mV/°C
V130
Voltage at 130°C ±5°C(2)
2. Measured at VDD = 3 V ±10 mV. V30 ADC conversion result is stored in the TS_CAL1 byte.
640
670
700
mV
IDDA(TEMP)(3)
Current consumption
-
3.4
6
µA
tSTART(3)
3. Guaranteed by design, not tested in production.
Startup time
-
-
10
µs
TS_temp(4)(3)
4. Shortest sampling time can be determined in the application by multiple iterations.
ADC sampling time when reading the
temperature
10
-
-



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