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ADM1266ACPZ-R7 Fiches technique(PDF) 9 Page - Analog Devices |
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ADM1266ACPZ-R7 Fiches technique(HTML) 9 Page - Analog Devices |
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9 / 62 page ![]() Data Sheet ADM1266 Rev. A | Page 9 of 62 Parameter Min Typ Max Unit Test Conditions/Comments REFERENCE OUTPUT Reference Output Voltage (VREF) 2.006 2.020 2.031 V VREF, no load Load Regulation −0.25 mV Sourcing current, IDACxMAX = −100 µA 0.25 mV Sinking current, IDACxMAX = 100 µA Minimum Load Capacitance 1 µF Capacitor required for decoupling, stability TEMPERATURE SHUTDOWN (TSD) TSD Rising 150 °C TSD Hysteresis 20 °C EEPROM RELIABILITY Endurance1 10,000 Cycles TJ = 85°C Data Retention2 10 Years TJ = 85°C 1 Endurance is qualified as per JEDEC Standard 22, Method A117. 2 Retention lifetime equivalent at junction temperature (TJ) = 85°C as per JEDEC Standard 22, Method A117. Retention lifetime derates with junction temperature. |
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