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A5975AD Fiches technique(PDF) 10 Page - STMicroelectronics |
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A5975AD Fiches technique(HTML) 10 Page - STMicroelectronics |
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10 / 50 page ![]() Datasheet parameters over the temperature range A5975AD 10/50 Doc ID 018761 Rev 1 4 Datasheet parameters over the temperature range 100% of the population in the production flow is tested at three different ambient temperatures (-40 °C, +25 °C, +125 °C) to guarantee the datasheet parameters inside the junction temperature range (-40 °C; +125 °C). The device operation is guaranteed when the junction temperature is inside the (-40 °C; +150 °C) temperature range. The user can estimate the silicon temperature increase with respect to the ambient temperature evaluating the internal power losses generated during device operation (please refer to Section 2.2). However, the embedded thermal protection disables the switching activity to protect the device in case the junction temperature reaches the TSHTDWN (+150 °C±10 °C) temperature. All the datasheet parameters can be guaranteed to a maximum junction temperature of +125 °C, to avoid triggering the thermal shutdown protection during the testing phase due to self heating. |
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