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LP5910 Fiches technique(PDF) 16 Page - Texas Instruments |
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LP5910 Fiches technique(HTML) 16 Page - Texas Instruments |
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16 / 29 page ![]() Time (µs) -25 0 25 50 75 100 125 150 0 0 0.5 0.5 1 1 1.5 1.5 2 2 2.5 2.5 D021 VIN VOUT Time (µs) -20 -10 0 10 20 30 40 50 60 70 80 0 -12 20 -8 40 -4 60 0 80 4 100 8 120 12 D022 IOUT 'VOUT 16 LP5910 SNVSA91C – SEPTEMBER 2015 – REVISED JUNE 2016 www.ti.com Product Folder Links: LP5910 Submit Documentation Feedback Copyright © 2015–2016, Texas Instruments Incorporated Unfortunately, this RθJA is highly dependent on the heat-spreading capability of the particular PCB design, and therefore varies according to the total copper area, copper weight, and location of the planes. The RθJA recorded in Thermal Information is determined by the specific EIA/JEDEC JESD51-7 standard for PCB and copper- spreading area, and is to be used only as a relative measure of package thermal performance. For a well- designed thermal layout, RθJA is actually the sum of the package junction-to-case (bottom) thermal resistance (RθJCbot) plus the thermal resistance contribution by the PCB copper area acting as a heat sink. 8.2.2.9 Estimating Junction Temperature The EIA/JEDEC standard recommends the use of psi (Ψ) thermal characteristics to estimate the junction temperatures of surface mount devices on a typical PCB board application. These characteristics are not true thermal resistance values, but rather package specific thermal characteristics that offer practical and relative means of estimating junction temperatures. These psi metrics are determined to be significantly independent of copper-spreading area. The key thermal characteristics (ΨJT and ΨJB) are given in Thermal Information and are used in accordance with Equation 4 or Equation 5. TJ(MAX) = TTOP + (ΨJT × PD(MAX)) where • PD(MAX) is explained in Equation 1. • TTOP is the temperature measured at the center-top of the device package. (4) TJ(MAX) = TBOARD + (ΨJB × PD(MAX)) where • PD(MAX) is explained in Equation 1. • TBOARD is the PCB surface temperature measured 1-mm from the device package and centered on the package edge. (5) For more information about the thermal characteristics ΨJT and ΨJB, see the TI Application Report: Semiconductor and IC Package Thermal Metrics (SPRA953), available for download at www.ti.com. For more information about measuring TTOP and TBOARD, see the TI Application Report: Using New Thermal Metrics (SBVA025), available for download at www.ti.com. For more information about the EIA/JEDEC JESD51 PCB used for validating RθJA, see the TI Application Report: Thermal Characteristics of Linear and Logic Packages Using JEDEC PCB Designs (SZZA017), available for download at www.ti.com. 8.2.3 Application Curves VEN = VIN VOUT = 1.8 V COUT = 1 µF Figure 26. Turnon Time VIN = 2.3 V VOUT = 1.8 V COUT = 1 µF IOUT = 1 mA to 100 mA tRISE = 10 µs Figure 27. Load Transient Response |
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