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CAP1203 Fiches technique(PDF) 19 Page - Microchip Technology |
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CAP1203 Fiches technique(HTML) 19 Page - Microchip Technology |
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19 / 59 page ![]() 2013-2015 Microchip Technology Inc. DS00001572B-page 19 4.8.4 INTERRUPTS FOR MULTIPLE TOUCH PATTERN DETECTION An interrupt can be generated when the MTP pattern is matched (see Section 5.14, "Multiple Touch Pattern Configura- tion Register"). 4.8.5 INTERRUPTS FOR SENSOR INPUT CALIBRATION FAILURES An interrupt can be generated when the ACAL_FAIL bit is set, indicating the failure to complete analog calibration of one or more sensor inputs(see Section 5.2, "Status Registers"). This interrupt can be enabled by setting the ACAL_- FAIL_INT bit (see Section 5.6, "Configuration Registers"). An interrupt can be generated when the BC_OUT bit is set, indicating the base count is out of limit for one or more sen- sor inputs(see Section 5.2, "Status Registers"). This interrupt can be enabled by setting the BC_OUT_INT bit (see Sec- tion 5.6, "Configuration Registers"). |
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