| Moteur de recherche de fiches techniques de composants électroniques |
|
AN2834 Fiches technique(PDF) 35 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
AN2834 Fiches technique(HTML) 35 Page - STMicroelectronics |
|
35 / 45 page ![]() DocID15067 Rev 2 35/45 AN2834 How to get the best ADC accuracy 44 3.4 High impedance source measurement This section describes the ADC measurement behavior of STM32x ADC when a signal source with high internal impedance is used. It explains how to design an application to reach the requested precision and provides workarounds. 3.4.1 ADC input stage problem The ADC in STM32x devices is a switched-capacitor ADC type. Switched capacitors work also as sampling capacitors (see Section 1.1 for a detailed explanation). When a signal comes from a voltage source with high internal impedance (for instance, 150 k ), an added error can be seen in measurement results. Error signals have also been observed on the ADC input pin, as shown in Figure 33 (if the voltage source has zero voltage: Uin = 0 V, Rin = 150 k, Cext = 0 pF): Figure 31. Typical voltage source connection to ADC input Figure 32. Noise observed on ADC input pin during ADC conversions ADC input ai17903 STM32 Uin Rin C ext ADC input signal during conversion: an ADC noise is injected to the input. ai17904 |
|
Lien URL |
| ALLDATASHEET vous a-t-il été utile ? [ DONATE ] |
À propos de Alldatasheet | Publicité | Contactez-nous | Politique de confidentialité | Lien vers la fiche technique | Echange de liens | Fabricants All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |