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74HC366D Fiches technique(PDF) 12 Page - NXP Semiconductors |
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74HC366D Fiches technique(HTML) 12 Page - NXP Semiconductors |
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12 / 19 page ![]() 74HC_HCT366_3 © NXP B.V. 2006. All rights reserved. Product data sheet Rev. 03 — 21 November 2006 12 of 19 NXP Semiconductors 74HC366; 74HCT366 Hex buffer/line driver; 3-state; inverting Table 10. Measurement points Type Input Output VM VM VX VY 74HC366 0.5VCC 0.5VCC 0.1 × V CC 0.9 × V CC 74HCT366 1.3 V 1.3 V 0.1 × V CC 0.9 × V CC Test data is given in Table 11. Definitions test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator CL = Load capacitance including jig and probe capacitance RL = Load resistor S1 = Test selection switch Fig 8. Load circuitry for measuring switching times VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf 001aad983 DUT VCC VCC VI VO RT RL S1 CL open PULSE GENERATOR Table 11. Test data Type Input Load S1 position VI tr, tf CL RL tPHL, tPLH tPZH, tPHZ tPZL, tPLZ 74HC366 VCC 6 ns 15 pF, 50 pF 1 k Ω open GND VCC 74HCT366 3 V 6 ns 15 pF, 50 pF 1 k Ω open GND VCC |
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