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STLVD111 Fiches technique(PDF) 4 Page - STMicroelectronics |
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STLVD111 Fiches technique(HTML) 4 Page - STMicroelectronics |
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4 / 12 page ![]() STLVD111 4/12 DRIVER ELECTRICAL CHARACTERISTICS (TA = -40 to 85 °C, VCC = 2.5V ± 5%, unless otherwise specified (Note 1, 2) NOTE 1: All currents into device pins are positive; all currents out of device pins are negative. All voltages are referenced to device ground unless otherwise specified. NOTE 2: All typical values are given for VCC =2.5V and TA = 25°C unless otherwise stated. LVDS TIMING CHARACTERISTICS (TA = -40 to 85 °C, VCC = 2.5V ± 5%, unless otherwise specified (Note 4) NOTE 4: Generator waveforms for all test conditions: f=1MHz, ZO =50 Ω (unless otherwise specified). CONTROL REGISTER TIMING CHARACTERISTICS (TA =-40 to 85 °C, VCC = 2.5V ± 5%, EN=H, unless otherwise specified (Figure 4) Symbol Parameter Test Conditions Value Unit Min. Typ. Max. VBB Output Reference Voltage VCC = 2.5 V 1.15 1.25 1.35 V ICCD Power Supply Current All driver enabled and loaded 125 160 mA CIN Input Capacitance VI =0V toVCC 5pF COUT Output Capacitance 5 pF VIH Logic Input High Threshold VCC = 2.5 V 2 V VIL Logic Input Low Threshold VCC = 2.5 V 0.8 V II Logic Input Current VCC = 2.5 V, VIN =VCC or GND ±10 µA Symbol Parameter Test Conditions Value Unit Min. Typ. Max. tTLH, tTHL Transition Time RL = 100 Ω,CL = 5 pF, Fig. 5, 6) 220 300 ps tPHL, tPLH Propagation Delay Time (Fig. 5, 6) 2 2.5 ns fMAX Maximum Input Frequency 700 900 MHz tSKEW Bank Skew (Fig. 1) 50 ps Part to Part Skew (Fig. 2) 100 Pulse Skew (Fig. 3) 50 Symbol Parameter Test Conditions Value Unit Min. Typ. Max. fMAX Maximum Frequency of Shift Register (Fig. 7) 100 150 MHz ts Clock to SI Setup Time (Fig. 7) 2 ns th Clock to SI Hold Time (Fig. 7) 1.5 ns trem Enable to Clock Removal Time (Fig. 7) 1.5 ns tW Minimum Clock Pulse Width (Fig. 7) 3 ns |
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