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AD5273BRJZ100-R7 Fiches technique(PDF) 5 Page - Analog Devices

No de pièce AD5273BRJZ100-R7
Description  64-Position OTP Digital Potentiometer
PDF  20 Pages
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Fabricant  AD [Analog Devices]
Site Internet  http://www.analog.com
Logo AD - Analog Devices

AD5273BRJZ100-R7 Fiches technique(HTML) 5 Page - Analog Devices

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Data Sheet
AD5273
Rev. J | Page 5 of 20
Parameter
Symbol
Test Conditions/Comments
Min
Typ1
Max
Unit
DYNAMIC CHARACTERISTICS7, 13, 14
Bandwidth, −3 dB
BW_1 kΩ
R
AB = 1 kΩ, code = 0x20
6000
kHz
BW_10 kΩ
R
AB = 10 kΩ, code = 0x20
600
kHz
BW_50 kΩ
R
AB = 50 kΩ, code = 0x20
110
kHz
BW_100 kΩ
R
AB = 100 kΩ, code = 0x20
60
kHz
Total Harmonic Distortion
THD
W
V
A = 1 V rms, RAB = 1 kΩ, VB = 0 V,
f = 1 kHz
0.05
%
Adjustment Settling Time
t
S1
V
A = 5 V ± 1 LSB error band,
V
B = 0 V, measured at VW
5
µs
Power-Up Settling Time—
After Fuses Blown
t
S2
V
A = 5 V ± 1 LSB error band,
V
B = 0 V, measured at VW, VDD = 5 V
5
µs
Resistor Noise Voltage
e
N_WB
R
AB = 1 kΩ, f = 1 kHz, code = 0x20
3
nV/√Hz
INTERFACE TIMING CHARACTERISTICS7,14,15
Applies to all parts
SCL Clock Frequency
f
SCL
400
kHz
t
BUF Bus Free Time Between
Stop and Start
t
1
1.3
µs
t
HD; STA Hold Time
(Repeated Start)
t
2
After this period, the first clock
pulse is generated
0.6
µs
t
LOW Low Period of SCL Clock
t
3
1.3
µs
t
HIGH High Period of SCL Clock
t
4
0.6
50
µs
t
SU; STA Setup Time for
Start Condition
t
5
0.6
µs
t
HD; DAT Data Hold Time
t
6
0.9
µs
t
SU; DAT Data Setup Time
t
7
0.1
µs
t
F Fall Time of Both SDA and
SCL Signals
t
8
0.3
µs
t
R Rise Time of Both SDA and
SCL Signals
t
9
0.3
µs
t
SU; STO Setup Time for Stop Condition
t
10
0.6
µs
OTP Program Time
t
11
400
ms
1 Typical values represent average readings at 25°C, V
DD = 5 V, and VSS = 0 V.
2 Resistor position nonlinearity error, R-INL, is the deviation from an ideal value measured between the maximum resistance and the minimum resistance wiper
positions. R-DNL measures the relative step change from ideal between successive tap positions. Parts are guaranteed monotonic.
3 V
AB = VDD, wiper (VW) = no connect.
4 ∆R
WB/∆T = ∆RWA/∆T. Temperature coefficient is code-dependent; see the Typical Performance Characteristics section.
5 INL and DNL are measured at V
W. INL with the RDAC configured as a potentiometer divider similar to a voltage output DAC. VW with the RDAC configured as a
potentiometer divider similar to a voltage output DAC. VA = VDD and VB = 0 V. DNL specification limits of ±1 LSB maximum are guaranteed monotonic operating
conditions.
6 The A, B, and W resistor terminals have no limitations on polarity with respect to each other.
7 Guaranteed by design; not subject to production test.
8 The minimum voltage requirement on the V
IH is 0.7 × VDD. For example, VIH min = 3.5 V when VDD = 5 V. It is typical for the SCL and SDA resistors to be pulled up to VDD.
However, care must be taken to ensure that the minimum VIH is met when the SCL and SDA are driven directly from a low voltage logic controller without pull-up resistors.
9 Different from the operating power supply; the power supply for OTP is used one time only.
10 Different from the operating current; the supply current for OTP lasts approximately 400 ms for the one time it is needed.
11 See Figure 28 for the energy plot during the OTP program.
12 P
DISS is calculated from (IDD × VDD). CMOS logic level inputs result in minimum power dissipation.
13 Bandwidth, noise, and settling time depend on the terminal resistance value chosen. The lowest R value results in the fastest settling time and highest bandwidth.
The highest R value results in the minimum overall power consumption.
14 All dynamic characteristics use V
DD = 5 V.
15 See Figure 29 for the location of the measured values.



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