| Moteur de recherche de fiches techniques de composants électroniques |
|
LCDP1511D Fiches technique(PDF) 4 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
LCDP1511D Fiches technique(HTML) 4 Page - STMicroelectronics |
|
4 / 6 page ![]() Pulse ( µs) Vp C1 C2 LR1 R2 R3 R4 IPP Rp tr tp (V) ( µF) (nF) ( µH) ( Ω)(Ω)(Ω)(Ω) (A) ( Ω) 10 700 1000 20 200 0 50 15 25 25 10 60 1.2 50 1500 1 33 0 76 13 25 25 15 60 2 10 2500 10 0 1.1 1.3 0 3 3 10 245 TEST CIRCUIT FOR VFP AND VDGL PARAMETERS This is a GO-NO GO test which allows to confirm the holding current (IH) level in a functional test circuit. TEST PROCEDURE : - Adjust the current level at the IH value by short circuiting the D.U.T. - Fire the D.U.T. with a surge current : IPP = 15A, 10/1000 µs. - The D.U.T. will come back to the off-state within a duration of 50ms max. CC R R TIP RING GND VP 4 3 2 R 2 R1 (V is defined in unload condition) P L 1 R -VP V BAT -48 V = Surge generator D.U.T. FUNCTIONAL HOLDING CURRENT (IH) TEST CIRCUIT : GO-NO GO TEST LCDP1511D 4/6 |
|
|
Lien URL |
| ALLDATASHEET vous a-t-il été utile ? [ DONATE ] |
À propos de Alldatasheet | Publicité | Contactez-nous | Politique de confidentialité | Lien vers la fiche technique | Echange de liens | Fabricants All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |