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CD74HC173M Fiches technique(PDF) 9 Page - Texas Instruments |
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CD74HC173M Fiches technique(HTML) 9 Page - Texas Instruments |
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9 / 25 page ![]() Figure 6-5. HC setup times, hold times, removal time, and propagation delay times for edge triggered sequential logic circuits Figure 6-6. HCT setup times, hold times, removal time, and propagation delay times for edge triggered sequential logic circuits Figure 6-7. HC three-state propagation delay waveform Figure 6-8. HCT three-state propagation delay waveform NOTE: Opend drain waveforms tPLZ and tPZL are the same as those for three-state shown on the left. The test circuit is Output RL = 1kΩ to VCC, CL = 50pF Figure 6-9. HC and HCT three-state propagation delay test circuit www.ti.com CD54HC173, CD74HC173, CD54HCT173, CD74HCT173 SCHS158F – NOVEMBER 1998 – REVISED MARCH 2022 Copyright © 2022 Texas Instruments Incorporated Submit Document Feedback 9 Product Folder Links: CD54HC173 CD74HC173 CD54HCT173 CD74HCT173 |
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