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PLUS16R4DA Fiches technique(PDF) 14 Page - NXP Semiconductors |
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PLUS16R4DA Fiches technique(HTML) 14 Page - NXP Semiconductors |
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14 / 16 page ![]() Philips Semiconductors Programmable Logic Devices Product specification PLUS16R8D/-7 SERIES PAL devices 16L8, 16R8, 16R6, 16R4 September 10, 1993 49 OUTPUT REGISTER PRELOAD VOH REGISTERED I/O INPUT OUTPUT VOL VIH VIL VIHH VIL VIH VIL PIN 1 CLOCK PIN 11 OE td tsu tw td td NOTE: td = tsu = tw = 100ns to 1000ns. VIHH = 10.25V to 10.75V. The output registers can be preloaded to any desired state during device testing. This permits any state to be tested without having to step through the entire state-machine sequence. Each register is preloaded individually by following the steps given below. Step 1. With VCC at 5V and Pin 1 at VIL, raise Pin 11 to VIHH. Step 2. Apply either VIL or VIH to the output corresponding to the register to be preloaded. Step 3. Pulse Pin 1, clocking in preload data. Step 4. Remove output voltage, then lower Pin 11 to VIL. Preload can be verified by observing the voltage level at the output pin. Pin number references for DIP package. |
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