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L6572 Fiches technique(PDF) 9 Page - STMicroelectronics |
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L6572 Fiches technique(HTML) 9 Page - STMicroelectronics |
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9 / 22 page ![]() L6572 Electrical characteristics Doc ID 023882 Rev 1 9/22 Figure 4. Test signal where: ● Test A: starting voltage Vm = ± 465 mV, half period T = 6,67 μs (f = 75 kHz; tDT = 2,5 μs) ● Test B: starting voltage Vm = ± 340 mV, half period T = 10,0 μs (f = 50 kHz; tDT = 2,5 μs) ● Test C: starting voltage Vm = ± 340 mV, half period T = 12,5 μs (f = 40 kHz; tDT = 2,5 μs) ● T measured from the falling edge of HVG (LVG) to the falling edge of LVG (HVG). TPB Temperature threshold for powerboost activation (1) 64 80 106 °C VTSD VTSD low voltage threshold 5.5 6.2 6.9 V VTSD-Z Zener voltage on TSD pin ITSD = 600 µA (2) 11.5 12.8 14.0 V ITSD Current consumption TSD-function VTSD = 11 V 30 40 50 µA 1. Guaranteed by design. 2. For a correct operation of the TSD function, the internal clamping diode has always to be turned on with the minimum supply voltage of the device. Table 5. Electrical characteristics (continued) Symbol Parameter Test condition Min. Typ. Max. Unit T tT1/2on tDT Vm Aint HVG LVG SENSE AM14884v1 |
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