T4-LDS-0245, Rev. 2 (5/31/13)

©2013 Microsemi Corporation

Page 5 of 6

1N4614UR-1 – 1N4627UR-1e3,

1N4099UR-1 – 1N4135UR-1e3

NOTE 1: These may be ordered as either 1N4614UR-1 thru 1N4627UR-1 and 1N4099UR-1 thru 1N4135UR-1 or CDLL4614-1 thru CDLL4627-1 and

CDLL4099-1 thru CDLL4135-1. For 1N military types, add the JAN, JANTX, JANTXV prefix for required screening to the industry part

number.

NOTE 2: The JEDEC type numbers shown above have a standard tolerance of +/-5% on the nominal Zener voltage. VZ is measured with the diode in

thermal equilibrium (still air) at 25

oC for end-cap terminations.

NOTE 3: Zener impedance is derived by superimposing on IZT a 60 Hz rms ac current at 10% of IZT. See MicroNote 202 for ZZT variation with IZ.

GRAPHS

FIGURE 1 – Noise Density Measurement Circuit

Noise density, (ND) is specified in microvolt-rms per square-root-hertz.

Actual measurement is performed using a 1 KHz to 3 KHz frequency

bandpass filter at a constant Zener test current (IZT) at 25

oC ambient

temperature. ND is calculated from the formula.

Zener Voltage VZ

FIGURE 3 – Capacitance vs. Zener Voltage (Typical)

Temperature (

oC)

FIGURE 2 – Power Derating Curve