PCF2131 datasheet(64/86 Pages) NXP

64 / 86 page

NXP Semiconductors

PCF2131

Nano-power highly accurate RTC with integrated quartz crystal

VDD = 1.2 V to 5.5 V; VSS = 0 V; Tamb = +25 °C, unless otherwise specified.

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

TC_DIS = 1, Tamb = 25 °C

[1][2]

- 3

ppm

crystal aging

PCF2131

Δfxtal/fxtal

relative crystal

frequency variation

first year;

VDD or VBAT = 3.3 V

[3] - 3

ppm

Δf/ΔV

frequency variation

with voltage

on pin CLKOUT

±1

ppm/V

Jitter

Output clock peak to

peak jitter

on pin CLKOUT

Table 90. Frequency characteristics...continued

[1]

±1 ppm corresponds to a time deviation of ±0.0864 seconds per day.

[2]

Only valid if CLKOUT frequencies are not equal to 32.768 kHz or if CLKOUT is disabled.

[3]

Not production tested. Effects of reflow soldering are included (see application note AN13202).

Temperature (°C)

-40

100

aaa-041587

-40

Frequency

stability

(ppm)

-80

± 3 ppm

(1)

(2)

1. Typical temperature compensated RTC time accuracy response (TC_DIS = 0).

2. Typical CLKOUT frequency Y [ppm] = -0.035*(T-25C)2 (TC_DIS = 0 or 1).

Figure 39. Typical characteristic of frequency with respect to temperature of PCF2131

PCF2131

All information provided in this document is subject to legal disclaimers.

Product data sheet

Rev. 1.0 — 28 May 2021

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