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AFSC5G35E38T2 Fiches technique(PDF) 4 Page - NXP Semiconductors |
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AFSC5G35E38T2 Fiches technique(HTML) 4 Page - NXP Semiconductors |
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4 / 16 page ![]() 4 RF Device Data NXP Semiconductors AFSC5G35E38 Table 2. Maximum Ratings Rating Symbol Value Unit Gate--Bias Voltage Range VG –0.5 to +10 Vdc Operating Voltage Range VDD 24 to 31 Vdc Storage Temperature Range Tstg –65 to +150 C Case Operating Temperature TC 125 C Peak Input Power (3500 MHz, Pulsed CW, 10 sec(on), 10% Duty Cycle) Pin 25 dBm Table 3. Lifetime Characteristic Symbol Value Unit Mean Time to Failure Case Temperature 125C, 7WAvg.,31Vdc MTTF >10 Years Table 4. ESD Protection Characteristics Test Methodology Class Human Body Model (per JS--001--2017) 1A Charge Device Model (per JS--002--2014) C2a Table 5. Moisture Sensitivity Level Test Methodology Rating Package Peak Temperature Unit Per JESD22--A113, IPC/JEDEC J--STD--020 3 260 C |
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