MCH03

Ceramic capacitors

Rev.A

8/12

Items

Performance

Heat life

test

Test Method

(As per JIS C 5101-1, JIS C 5101-10)

No.

15

A, AN

A, AN

F N

F N

Within

+/−30.0%

Appearance

Dielectric

loss

tangent

Insulation

resistance

Change

rate from

initial value

Without mechanical damage.

C N

C N

Not less than 1000M

Ω or

50M

Ω µF, whichever is less.

(For products with rated voltage less

than 16V, it is not less than 1000m

Ω

or 10M

Ω µF, whichever is less.)

As per 4.23 of JIS C 5101-1.

As per 4.15 of JIS C 5101-10

Test

temperature(

Voltage

Test

time (h)

A, AN

125

85

(B, X5R)

200%

Rated

voltage

200%

Rated

voltage

200%

Rated

voltage

200%

Rated

voltage

1000

+48/−0

1000

+48/−0

1000

+48/−0

125

(R, X7R)

85

CN

FN

Initial measurements prior to test shall be

made after the voltage pre-conditioning

specified in Remarks (2).

Final measurements shall be made after

the specimens have been left at room

temperature

[Remarks]

Pre-conditioning

If specified in test method of as per 3(Performance and test merhod), capacitors of CN, FN

characteristics shall be pre-conditionded as follows.

(1) Thermal pre-conditioning

Prior to initial measurements, specimens shall be conditioned at a temperature of 150 0

/−10

°C

for a period of 1hr., and shall be allowed to stabilize at room temperature for 48

+/−4h

(2) Voltage pre-conditioning

Prior to initial measurements, voltage specified as a test condition shall be applied to specimens

for a period of 1hr., and the specimens shall be allowed to stabilize at room temperature for 48

+/−4h

Soldering

Glass epoxy

substrate

< T e s t j i g >

Within

+/−15.0%

Within

+/−25.0%

Within

+/−3.0% or

+/−0.3pF whichever

is larger.

Rated

voltage

25V,16V

Rated

voltage

6.3V

tan

δ 0.3%

<−

Less than 200% of

initial spec.

Less than 150% of

initial spec.

Table3

24

+/−2 h

48

+/−4 h

Charac-

teristic

Time

A, AN

CN, FN