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PCM4108CPAPT Fiches technique(PDF) 2 Page - Texas Instruments

No de pièce PCM4108CPAPT
Description  HIGH-PERFORMANCE, 24-BIT, 216kHz SAMPLING, EIGHT-CHANNEL AUDIO DIGITAL-TO-ANALOG CONVERTER
PDF  39 Pages
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Fabricant  TI [Texas Instruments]
Site Internet  http://www.ti.com
Logo TI - Texas Instruments

PCM4108CPAPT Fiches technique(HTML) 2 Page - Texas Instruments

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PCM4108
SBAS354 − JUNE 2005
www.ti.com
2
ORDERING INFORMATION(1)
PRODUCT
PACKAGE−LEAD
PACKAGE
DESIGNATOR
SPECIFIED
TEMPERATURE
RANGE
PACKAGE
MARKING
ORDERING
NUMBER
TRANSPORT
MEDIA, QUANTITY
PCM4108
HTQFP-64
PAP
−10
°C to +70°C
PCM4108PAP
PCM4108PAPT
Tape and Reel, 250
PCM4108
HTQFP-64
PAP
−10
°C to +70°C
PCM4108PAP
PCM4108PAPR
Tape and Reel, 1500
(1) For the most current package and ordering information, see the Package Option Addendum located at the end of this data sheet, or refer to
our web site at www.ti.com.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate
precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to
damage because very small parametric changes could cause the device not to meet its published specifications.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted(1)
PCM4108
UNIT
Supply voltage
VCC
+6.0
V
Supply voltage
VDD
+3.6
V
Ground voltage difference
Any AGND-to-AGND and AGND-to-DGND
±0.1
V
Digital input voltage
FS0, FS1, FMT0, FMT1, FMT2, CDOUT,
CDIN, CCLK, CSA, CSB, DATA0, DATA1,
DATA2, DATA3, BCK, LRCK, SCKI, SUBA,
SUBB, DEM0, DEM1, MUTE, RST, MODE
−0.3 to (VDD + 0.3)
V
Input current (any pin except supplies)
±10
mA
Operating temperature range
−10 to +70
°C
Storage temperature range, TSTG
−65 to +150
°C
(1) Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute maximum
conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or
any other conditions beyond those specified is not implied.



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