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ATSAM3103 Fiches technique(PDF) 9 Page - ATMEL Corporation |
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ATSAM3103 Fiches technique(HTML) 9 Page - ATMEL Corporation |
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9 / 24 page ![]() 9 ATSAM3103 6093A–DRMSD–25-Oct-04 P1.4 28 I/O 12 General-purpose I/O pin SMWE 27 Out 13 SmartMedia write enable (WE), active low P1.3 27 I/O 13 General-purpose I/O pin SMCLE 26 Out 14 SmartMedia command latch enable (CLE) P1.2 26 I/O 14 General-purpose I/O pin DFCS 14 Out - DataFlash chip select DFSI 16 Out - DataFlash serial input (to DataFlash) DFSO 21 In Pd - DataFlash serial output (from DataFlash). This pin has a built-in pull- down. It may be left open if not used. DFSCK 15 Out - DataFlash data clock P1.15 - P1.11 30, 62, 61, 54, 53 I/O Pu - Five General-purpose I/O pins. These pins have built-in pull-ups. They may be left open if not used. X1 - X2 45, 44 - - External crystal connection. Standard frequencies are 6.9552 MHz, 9.6 MHz, 11.2896 MHz, 12.288 MHz. Max frequency is 12.5 MHz. An external clock (max. 1.8V PP) can be connected to X1 using AC coupling (22 pF). A built-in PLL multiplies the clock frequency by 4 for internal use. LFT 47 - - PLL decoupling RCR filter RESET 22 In - Master reset Schmitt trigger input, active low. RESET should be held low during at least 10 ms after power is applied. On the rising edge of RESET, the chip enters an initialization routine, which may involve firmware download from an external SmartMedia, DataFlash or host. STIN 23 In Pd - Serial test input. This is a 57.6 Kbaud asynchronous input used for firmware debugging. This pin is tested at power-up. The built-in debugger starts if STIN is found high. STIN has a built-in pull-down. It should be grounded or left open for normal operation. STOUT 24 Out - Serial test output. 57.6 Kbaud async output used for firmware debugging. PDWN 20 In - Power down input, active low. High level on this pin is typ. VC18. When PDWN is low, the oscillator and PLL are stopped, the power switch opens, and the chip enters a deep sleep mode (1 µA typ. consumption when power switch is used). To exit from power down, PDWN has to be set high then RESET applied. Alternate programmable power-downs are available which allow warm restart of the chip. TEST 33 In Pd - Test input. Should be grounded or left open. Table 2. Pinout by Pin Name (Continued) Pin Name Pin Number Type Sharing Description |
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