| Moteur de recherche de fiches techniques de composants électroniques |
|
AM29SL800D Fiches technique(PDF) 28 Page - Advanced Micro Devices |
|
|
|||||||||||||||||||||||||||||
AM29SL800D Fiches technique(HTML) 28 Page - Advanced Micro Devices |
|
28 / 46 page ![]() ADV ANCE I N FO RMAT I O N March 17, 2003 Am29SL800D 27 TEST CONDITIONS Table 7. Test Specifications Key to Switching Waveforms CL Device Under Test Figure 11. Test Setup Test Condition -90, -100 -120, -150 Unit Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 30 100 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0–2.0 V Input timing measurement reference levels 1.0 V Output timing measurement reference levels 1.0 V WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) 2.0 V 0.0 V 1.0 V 1.0 V Output Measurement Level Input Figure 12. Input Waveforms and Measurement Levels |
|
Lien URL |
| ALLDATASHEET vous a-t-il été utile ? [ DONATE ] |
À propos de Alldatasheet | Publicité | Contactez-nous | Politique de confidentialité | Lien vers la fiche technique | Echange de liens | Fabricants All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |