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WM8198SCDS/R Fiches technique(PDF) 11 Page - Wolfson Microelectronics plc |
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WM8198SCDS/R Fiches technique(HTML) 11 Page - Wolfson Microelectronics plc |
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11 / 31 page ![]() WM8198 Production Data w PD Rev 4.0 June 2004 11 Test Conditions AVDD = DVDD1 = 5.0, DVDD2 = 3.3, AGND = DGND = 0V, TA = 25 °C unless otherwise stated. PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS SCK period tSPER 83.3 ns SCK high tSCKH 37.5 ns SCK low tSCKL 37.5 ns SDI set-up time tSSU 10 ns SDI hold time tSH 10 ns SCK to SEN set-up time tSCE 20 ns SEN to SCK set-up time tSEC 20 ns SEN pulse width tSEW 50 ns SEN low to SDO = Register data tSERD 35 ns SCK low to SDO = Register data tSCRD 35 ns SCK low to SDO = ADC data tSCRDZ 25 ns Note: 1. Parameters are measured at 50% of the rising/falling edge. |
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