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SMJ27C010A Fiches technique(PDF) 7 Page - Micross Components |
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SMJ27C010A Fiches technique(HTML) 7 Page - Micross Components |
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7 / 11 page ![]() UVEPROM UVEPROM UVEPROM UVEPROM UVEPROM SMJ27C010A AS27C010A SMJ27C010A AS27C010A Rev. 2.1 6/05 Austin Semiconductor, Inc. reserves the right to change products or specifications without notice. 7 Austin Semiconductor, Inc. PARAMETER MEASUREMENT INFORMATION NOTES: 1. C L includes probe and fixture capacitance. 2.08V Output Under Test R L = 800Ω CL = 100 pF1 FIGURE 3. READ-CYCLE TIMING AC testing inputs are driven at 2.4V for logic high and 0.4V for logic low. Timing measurements are made at 2V for logic high and 0.8V for logic low for both inputs and outputs. FIGURE 2. AC TEST OUTPUT LOAD CIRCUIT WAVEFORM |
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