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CDCVF2310MPWREP Fiches technique(PDF) 2 Page - Texas Instruments |
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CDCVF2310MPWREP Fiches technique(HTML) 2 Page - Texas Instruments |
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2 / 16 page ![]() 25 Ω 25 Ω 25 Ω 25 Ω 25 Ω 25 Ω 25 Ω 25 Ω 25 Ω 25 Ω Logic Control Logic Control 3 4 5 8 9 21 20 17 16 12 1Y0 1Y1 1Y2 1Y3 1Y4 2Y0 2Y1 2Y2 2Y3 2Y4 1G 2G CLK 11 13 24 CDCVF2310-EP SCAS934 – DECEMBER 2012 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. FUNCTIONAL BLOCK DIAGRAM 2 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links: CDCVF2310-EP |
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