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A6986F Fiches technique(PDF) 13 Page - STMicroelectronics |
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A6986F Fiches technique(HTML) 13 Page - STMicroelectronics |
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13 / 72 page ![]() DocID027739 Rev 1 13/72 A6986F Datasheet parameters over the temperature range 72 4 Datasheet parameters over the temperature range The 100% of the population in the production flow is tested at three different ambient temperatures (-40 °C, +25 °C, +135 °C) to guarantee the datasheet parameters inside the junction temperature range (-40 °C, +135 °C). The device operation is guaranteed when the junction temperature is inside the (-40 °C, +150 °C) temperature range. The designer can estimate the silicon temperature increase respect to the ambient temperature evaluating the internal power losses generated during the device operation. However the embedded thermal protection disables the switching activity to protect the device in case the junction temperature reaches the TSHTDWN (+165 °C typ.) temperature. All the datasheet parameters can be guaranteed to a maximum junction temperature of +135 °C to avoid triggering the thermal shutdown protection during the testing phase because of self-heating. |
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