LMP7300MMESLASHNOPB datasheet(7/30 Pages) TI1

7 / 30 page

LMP7300

www.ti.com

SNOSAT7G – AUGUST 2007 – REVISED OCTOBER 2015

6.7 Electrical Characteristics: 12-V

Unless otherwise specified, all limits are ensured for TA = 25°C, V

+ = 12 V, V− = 0 V, and V

CM = V

+/2, R

PULLUP = 100 kΩ,

CLOAD = 10 pF.

(1)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

TA = 25°C

Supply Current

RPULLUP = Open

µA

TJ = TA

COMPARATOR

TA = 25°C

±0.08

±0.75

VCM = V

+/2 SOIC

TJ = TA

±2

VOS

Input Offset Voltage

TA = 25°C

±0.08

±1

VCM = V

+/2 VSSOP

TJ = TA

±2.2

TCVOS

Input Offset Average Drift

See(2)

1.8

μV/°C

TA = 25°C

1.2

Input Bias Current(3)

|VID| > 2.5 V

TJ = TA

IOS

Input Offset Current

0.15

0.5

CMRR

Common Mode Rejection Ratio

1 V

≤ VCM ≤ 12 V

100

PSRR

Power Supply Rejection Ratio

V+ = 2.7 V to 12 V

100

VOL

Output Voltage Low

ILOAD = 10 mA

0.25

0.4

ILEAK

Output Leakage Current

Comparator Output in High State

0 < Ref-V+HYSTP, N < 25 mV

Hysteresis Control Voltage

HCLIN

mV/V

Linearity

25 mV < Ref-V+HYSTP, N < 100 mV

0.95

TA = 25°C

1.2

IHYS

Hysteresis Leakage Current

TJ = TA

Overdrive = 10 mV, CL = 10 pF

Propagation Delay

TPD

μs

(High to Low)

Overdrive = 100 mV, CL = 10 pF

3.5

6.8

REFERENCE

TJ = 25°C SOIC

2.043

2.048

2.053

Reference Voltage

TJ = 25°C VSSOP

2.043

2.048

2.056

Line Regulation

VCC = 2.7 V to 12 V

μV/V

mV/m

Load Regulation

IOUT = 0 to 1 mA

0.2

0.5

TCVREF/°

ppm/°

Temperature Coefficient

−40°C to 125°C

0.1 Hz to 10 Hz

μVPP

Output Noise Voltage

10 Hz to 10 kHz

100

μVRMS

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical

tables under conditions of internal self-heating where TJ > TA.

(2)

Offset voltage average drift determined by dividing the change in VOS at temperature extremes, by the total temperature change.

(3)

Positive current corresponds to current flowing into the device.

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