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MIC5013BM Fiches technique(PDF) 4 Page - Micrel Semiconductor |
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MIC5013BM Fiches technique(HTML) 4 Page - Micrel Semiconductor |
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4 / 16 page ![]() MIC5013 Micrel MIC5013 4 July 2000 Test Circuit Typical Characteristics 0 5 10 15 20 25 30 35 0 2 4 6 8 10 12 Supply Current SUPPLY VOLTAGE (V) 0 3 6 9 12 15 SUPPLY VOLTAGE (V) 0 2 4 6 8 10 12 14 DC Gate Voltage above Supply V+ I3 S3 I2 I8 Fault V+ Gate 1 2 3 4 8 MIC5013 Gnd 7 6 5 Thresh Sense Source Input 1nF I6 S1 + 1µF 50 Ω S2 3.5k VS 500 Ω 1W S4 V GATE V IN 03 69 12 15 SUPPLY VOLTAGE (V) High-side Turn-on Time* GATE C =10 nF 0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 03 69 12 15 0 50 100 150 200 250 300 350 SUPPLY VOLTAGE (V) High-side Turn-on Time* GATE C =1 nF * Time for gate to reach V+ + 5V in test circuit with VS = V+ – 5V (prevents gate clamp from interfering with measurement). |
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