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AN2064 Fiches technique(PDF) 11 Page - STMicroelectronics |
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AN2064 Fiches technique(HTML) 11 Page - STMicroelectronics |
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11 / 14 page ![]() AN2064 - APPLICATION NOTE 11/14 Figure 11 shows the measurement circuit used for this test series. During lightning and mains contact tests, the surge current (I surge) injected in Tip L or Ring L (transversal tests) or both Tip L and Ring L (longitudinal tests) has been measured. The remaining voltages at Tip S or Ring S have been also measured (V). The curves of the figures 12, 13 and 14 show the results, respectively, of : - a case of lightning test - a case of first level AC power fault test - a case of second level AC power fault test. These curves show no impact of both fuses and TRISIL during first level tests while the fuses open safely during certain second level tests. Figure 11: Measurement circuit Figure 12: Module behavior during 2/10µs 500A surge test Surge Generator I surge Line side V Protected device side Oscilloscope Current probe Voltage probe DUT Surge Generator I surge Line side V Protected device side Oscilloscope Current probe Voltage probe DUT I surge (100A/div) V (50V/div) |
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