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AN4009 Fiches technique(PDF) 13 Page - STMicroelectronics |
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AN4009 Fiches technique(HTML) 13 Page - STMicroelectronics |
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13 / 23 page ![]() AN4009 STEVAL-IFP019V1 demonstration board description Doc ID 022458 Rev 1 13/23 Figure 13. Burst timing waveform Table 3 shows the results of an inherent burst test. Normal performance has been observed when applying four different disturbance levels on the output ports and Vcc main voltage power supply. Note: 1 Outputs floating. 2 To reach same results reported in the tables above, it is necessary to replace C7 and C8 with two high voltage capacitors. Note: Outputs loaded by 1 k Ω resistors. Table 3. Application EFT (burst) robustness, applied to supply voltage lines Configuration EFT test signal amplitude, test result @ polarity (+/-) 1 kV 2 kV 3 kV 4 kV 5 kV Standard A / A A / A A / A B / B B / B Primary and secondary GNDs shorted A / A A / A B / A B / B B / B Table 4. Application EFT (burst) robustness, applied to output lines Configuration EFT test signal amplitude, test result @ polarity (+/-) 1 kV 2 kV 3 kV 4 kV 5 kV Standard A / A A / A B / B B / B B / B |
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